Journal
JOURNAL OF PHYSICAL CHEMISTRY C
Volume 124, Issue 43, Pages 23895-23904Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acs.jpcc.0c05503
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Funding
- Deutsche Forschungsgemeinschaft (DFG) [KU2321/6-1, WO533/20-1]
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In order to explore an alternative pathway to prepare ultrathin CoFe2O4 films, epitaxial CoO/Fe3O4 bilayers with varying film thickness of the CoO film were grown on Nb-doped SrTiO3(001) substrates via reactive molecular beam epitaxy. Thereafter, cobalt ferrite films with varying stoichiometry were prepared by post-deposition annealing at different temperatures. The thermally mediated interdiffusion resulted in the formation of vertical compressive and lateral tensile strained CoxFe3-xO4 films (x = 0.6 - 1.4) with homogeneous distribution of Fe and Co cations for each film. The chemical and electronic variations after each annealing step were studied by means of soft and hard X-ray photoelectron spectroscopy. The homogeneity of the cation distributions in the films were additionally verified after the last annealing step by angle-resolved hard X-ray photoelectron spectroscopy. For the cobalt ferrite film with x = 1.4, an additional crystallographic phase of Co1-yFeyO was observed by (grazing incidence) X-ray diffraction measurements after annealing at 600 degrees C. X-ray reflectivity measurements were performed to determine the film thickness of the formed CoxFe3-xO4 films.
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