Journal
JOURNAL OF APPLIED PHYSICS
Volume 128, Issue 13, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/5.0025933
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Funding
- DFG [SFB1170, SFB1143]
- Wurzburg-Dresden Cluster of Excellence on Complexity and Topology in Quantum Matter ct.qmat [EXC 2147, 390858490]
- BMBF [05K19WW2]
- FAPESP [2019/01946-1]
- CNPq [309867/2017-7]
- Hallwachs-Rontgen Postdoc Program of ct.qmat
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The layered van der Waals compounds ( MnBi 2 Te 4)( Bi 2 Te 3) were recently established as the first intrinsic magnetic topological insulators. We report a study on the epitaxial growth of ( MnBi 2 Te 4 ) m ( Bi 2 Te 3 ) n films based on the co-deposition of MnTe and Bi 2 Te 3 on BaF 2 (111) substrates. X-ray diffraction and scanning transmission electron microscopy evidence the formation of multilayers of stacked MnBi 2 Te 4 septuple layers and Bi 2 Te 3 quintuple layers with a predominance of MnBi 2 Te 4. The elemental composition and morphology of the films is further characterized by x-ray photoemission spectroscopy and atomic force microscopy. X-ray magnetic circular and linear dichroism spectra are comparable to those obtained for MnBi 2 Te 4 single crystals and confirm antiferromagnetic order in the films.
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