Journal
ELECTROCHIMICA ACTA
Volume 354, Issue -, Pages -Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.electacta.2020.136747
Keywords
Simulation; Regression; Complex capacitance; Frequency dispersion
Categories
Funding
- University of Florida Foundation Preeminence
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The Voigt measurement model is regressed to synthetic data to demonstrate its ability to extract capacitance, ohmic resistance, and polarization resistance values from impedance data. The systems explored include a Randles circuit, films with exponential and power-law distributions of resistivity, systems exhibiting geometric capacitance, and systems showing geometry-induced frequency dispersion. The Voigt measurement model is also regressed to complex capacitance to identify the high-frequency limit in Cole-Cole plots. The measurement model is shown to provide a useful means to estimate properties characteristic of electrochemical systems. (C) 2020 Elsevier Ltd. All rights reserved.
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