Journal
CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE
Volume 24, Issue 4, Pages -Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.cossms.2020.100832
Keywords
X-ray diffraction imaging; X-ray orientation microscopy; Polycrystal orientation mapping; Topotomography; X-ray diffraction contrast tomography
Funding
- European Union's Horizon 2020 research and innovation programme [VOXEL H2020-FETOPEN-2014-2015-RIA GA 665207]
- NVIDIA Corporation, through their GPU Grant Program
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Polycrystal orientation mapping techniques based on full-field acquisition schemes like X-ray Diffraction Contrast Tomography and certain other variants of 3D X-ray Diffraction or near-field High Energy Diffraction Microscopy enable time efficient mapping of 3D grain microstructures. The spatial resolution obtained with this class of monochromatic beam X-ray diffraction imaging approaches remains typically below the ultimate spatial resolution achievable with X-ray imaging detectors. Introducing a generalised reconstruction framework enabling the combination of acquisitions with different detector pixel size and sample tilt settings provide a pathway towards 3D orientation mapping with a spatial resolution approaching the one of state of the art X-ray imaging detector systems.
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