Journal
CERAMICS INTERNATIONAL
Volume 47, Issue 2, Pages 2735-2742Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.ceramint.2020.09.126
Keywords
Volume crystallization; Indialite; Microwave dielectric properties; XRPD; Refinement; Glass ceramics
Categories
Funding
- JSPS KAKENHI [22560673, 25420721, JP16K06735]
- Nokia Foundation 2016 [201700003]
- European Research Council [24001893]
- Grants-in-Aid for Scientific Research [22560673, 25420721] Funding Source: KAKEN
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Indialite/cordierite (Mg2Al4Si5O18) glass-ceramics with low dielectric constant and high Qf are potential materials for micro/millimeter-wave applications in 5G mobile communication systems. The addition of TiO2 was found to prevent cracking during surface crystallization, resulting in the formation of spherical crystals and specific precipitated phases. The reaction between cordierite and TiO2 produced the new Al2TiO5 phase, influencing the microwave dielectric properties.
Indialite/cordierite (Mg2Al4Si5O18) glass-ceramics with a low dielectric constant of 4.7 and a high Qf of >200 x 10(3) GHz are predicted for use as micro/millimeter-wave materials in the fifth generation (5G) mobile communication systems. The glass-ceramics have a serious cracking problem caused by the anisotropic crystal growth during the surface crystallization. In this paper, the cracking was prevented by adding TiO2 which acts as a seed. The glass-ceramics produced without cracking were composed of spherical crystals of approximately 10 mu m diameter, formed by volume crystallization. Precipitated phases of the glass-ceramics crystallized at 1200-1350 degrees C/10 h and 20 h were indialite, cordierite, Al2TiO5 and rutile. The glass-ceramics crystallized for 10 h were analyzed by the Rietveld method. Indialite precipitated as an intermediate metastable compound at the lower temperature of 1200 degrees C and transformed to cordierite at the crystallization temperature. The reaction between cordierite and TiO2 produced the new Al2TiO5 phase. The amounts of Al2TiO5 and rutile affected the microwave dielectric properties. In particular, the amount of rutile affected the TCf. In the cases of 10 wt % added TiO2, and the crystallized at 1250 degrees C for 10/20 h the TCf values were improved to -2/-8 ppm/degrees C.
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