4.7 Article

XPS spectral analysis for a multiple oxide comprising NiO, TiO2, and NiTiO3

Journal

APPLIED SURFACE SCIENCE
Volume 526, Issue -, Pages -

Publisher

ELSEVIER
DOI: 10.1016/j.apsusc.2020.146729

Keywords

X-ray photoelectron spectroscopy; Nickel titanate; Principal component analysis; Accurate quantification; Angle-resolved XPS; Nickel titanium

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XPS spectra collected from a mixture of NiO, TiO2, and NiTiO3 cannot be analyzed using a standard curve-fitting method; thus, principal component analysis (PCA) was conducted to accurately determine the ratio of various oxides in the mixture. Model samples comprising NiO, TiO2, and NiTiO3 exhibited a complex-shaped Ni 2p spectrum with a satellite peak, from which the atomic ratio of NiO and NiTiO3 could be accurately quantified using the PCA. In contrast, the Ti 2p spectrum exhibited a symmetric shape despite comprising both NiTiO3 and TiO2 states; thus, the PCA results predicted the ratio inaccurately. However, the PCA results showed linear correlation with the theoretical values over an entire range. Thus, accurate ratios were obtained using a cali-bration curve. The PCA procedure for multiple oxides was applied to angle-resolved XPS spectra for thermally oxidized nickel titanium alloy. The results revealed the in-depth distribution of NiO, TiO2, and NiTiO3 on the surface of the alloy.

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