4.8 Article

Overcoming Redox Reactions at Perovskite-Nickel Oxide Interfaces to Boost Voltages in Perovskite Solar Cells

Journal

JOULE
Volume 4, Issue 8, Pages 1759-1775

Publisher

CELL PRESS
DOI: 10.1016/j.joule.2020.06.004

Keywords

-

Funding

  1. U.S. Department of Energy's Office of Energy Efficiency and Renewable Energy (EERE) under Solar Energy Technologies Office (SETO) [DE-EE0008167, DE-EE0008552]
  2. Office of Naval Research [ONR N00014-18-1-2711, ONR N00014-20-1-2440, N00014-17-1-2525]
  3. ONR [N00014-18-1-2711]
  4. National Science Foundation Graduate research fellowship [DGE-1656518]
  5. National Science Foundation [1846685]
  6. Department of Defense
  7. U.S. Department of Energy Science Undergraduate Laboratory Internship Program
  8. U.S. Department of Energy (DOE) [DE-AC36-08GO28308]
  9. Directorate For Engineering
  10. Div Of Electrical, Commun & Cyber Sys [1846685] Funding Source: National Science Foundation

Ask authors/readers for more resources

Nickel oxide (NiOx) hole transport layers (HTLs) are desirable contacts for perovskite photovoltaics because they are low cost, stable, and readily scalable; however, they deliver lower open-circuit voltages (V(OC)s) compared to organic HTLs. Here, we characterize and mitigate electron transfer-proton transfer reactions between NiOx HTLs and perovskite precursors. Using XPS and UPS characterization, we identify that Ni >= 3+ metal cation sites in NiOx thin films act both as Bronsted proton acceptors and Lewis electron acceptors, deprotonating cationic amines and oxidizing iodide species, forming PbI2-xBrx-rich hole extraction barriers at the perovskite-NiOx. interface. Titrating reactive Ni >= 3+ surface states with excess A-site cation salts during perovskite active layer deposition yielded an increase in V-OC values to 1.15 V and power conversion efficiencies of similar to 20%. This may be a general finding for metal oxide contacts that act as Bronsted and Lewis acid-base reactants toward perovskite precursors, an observation that has also been made recently for TiO2 and SnO2 contacts.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.8
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available