Journal
MATHEMATICS AND MECHANICS OF SOLIDS
Volume 26, Issue 1, Pages 110-117Publisher
SAGE PUBLICATIONS LTD
DOI: 10.1177/1081286520948928
Keywords
Half-plane; conformal mapping; anisotropic material; thin film; complex variable method
Categories
Funding
- Natural Science Foundation of Jiangsu Province [BK20190393]
- National Natural Science Foundation of China [11902147]
- Priority Academic Program Development of Jiangsu Higher Education Institutions (PAPD)
Ask authors/readers for more resources
This paper discusses the use of conformal mapping to study anisotropic elastic half-planes and its application in two-dimensional deformation, finding that the key parameters of the mapping must satisfy simple geometric conditions.
The conformal mapping, which transforms a half-plane into a unit disk, has been used widely in studies involving an isotropic elastic half-plane under anti-plane shear or plane deformation. However, very little attention has been paid to the possibility of utilizing this mapping in the study of an anisotropic elastic half-plane under the same deformation. In this paper, we discuss a general case of an arbitrarily located anisotropic elastic half-plane that corresponds to several affine counterparts (resulting from corresponding complex variable formalism). We show that this mapping is indeed applicable to each of the affine half-planes if and only if the key parameters in the mapping satisfy simple geometrical conditions. In addition, we introduce the application of this mapping with the corresponding geometrical conditions to the related study of anisotropic thin films under two-dimensional deformation.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available