Journal
JOURNAL OF POWER SOURCES
Volume 466, Issue -, Pages -Publisher
ELSEVIER
DOI: 10.1016/j.jpowsour.2020.228283
Keywords
In situ transmission electron microscopy (TEM); Focused ion beam (FIB); Fluoride ion battery; All-solid-state battery; Electrode/electrolyte interfaces; Electrochemistry
Funding
- European Union [608575]
- DFG [FOR2093]
- Karlsruhe Nano Micro Facility (KNMF)
- IDB
Ask authors/readers for more resources
A focused ion beam (FIB) system is used to fabricate a micron-sized all-solid-state fluoride ion cell from a bulk battery for in situ transmission electron microscopy (TEM) testing. The bulk battery is based on a La0.9Ba0.1F2.9 solid-state electrolyte with a nanocomposite of Cu/C as a cathode and a nanocomposite of MgF2, Mg, La0.9Ba0.1T2.9 and C as an anode. The evolution of the morphology, structure, and composition of the electrodes and their interfaces with the electrolyte is characterized using in-situ TEM during electrochemical cycling. The high-resolution transmission electron microscopy (HRTEM) and scanning transmission electron microscopy-energy dispersive X-ray (STEM-EDX) analysis of the cathode-electrolyte interface reveal the expected formation of CuF2 phase during charging. During cycling, grain growth of Cu in the cathode ingredients and Cu diffusion from the cathode into the electrolyte are observed in addition to void formation.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available