Journal
JOURNAL OF PHYSICAL CHEMISTRY C
Volume 124, Issue 26, Pages 14167-14175Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acs.jpcc.0c01722
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Funding
- Deutsche Forschungsgemeinschaft (DFG) [FOR 1878, 214951840]
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Understanding the electronic structure between porphyrins and ultrathin metal-oxide film interfaces is vital for the rational design of functional molecular architectures. Here, we have studied the interfacial electronic properties of porphyrin molecular thin films on well-ordered thin layers of CoO(111) and metallic Co(100) surfaces by means of X-ray and ultraviolet photoemission spectroscopies. In this work, we observed the direct self-metalation of free-base porphyrin molecules at the interface to CoO(111) at room temperature by monitoring the N is core-level evolution. On metallic Co(100) films, no metalation occurs, but it can be induced by exposure to oxygen. The oxygen-induced metalation has, to the best of our knowledge, not been reported until now and might play an important role in processes where porphyrins are exposed to metals in a reactive environment.
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