4.6 Article

Infrared photoluminescence from GeO[SiO2] and GeO[SiO] solid alloy layers irradiated with swift heavy Xe ions

Journal

JOURNAL OF LUMINESCENCE
Volume 223, Issue -, Pages -

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ELSEVIER
DOI: 10.1016/j.jlumin.2020.117238

Keywords

Photoluminescence; Ge and Si oxides; Defects; Swift heavy ions

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Funding

  1. state re program of ISP SB RAS [0306-2019-0019]
  2. administration of Universit.e de Lorraine

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Germanium silicate suboxide films deposited from GeO/SiO and GeO/SiO2 precursors onto Si(001) substrates using evaporation in high vacuum were modified by swift heavy ions. The films were irradiated by 167 MeV Xe+26 ions with fluences varying from 1011 to 1013 cm(-2). We report photoluminescence in the infrared range both at low and at room temperature, which is most probably due to defect-induced radiative transitions in the films.

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