4.7 Article

Multiscale Surface Roughness for Improved Soil Moisture Estimation

Journal

IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING
Volume 58, Issue 8, Pages 5264-5276

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TGRS.2019.2961008

Keywords

Passive microwave; soil moisture (SM); soil moisture active passive (SMAP); surface roughness

Funding

  1. Schlumberger's Faculty for Future fellowship
  2. NASA THP grant [NNX09AK73G]
  3. NASA [NNX09AK73G, 114197] Funding Source: Federal RePORTER

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Surface roughness parameterization plays an important role in passive microwave soil moisture (SM) retrieval. This article proposes a new formulation for estimating surface roughness. The proposed model incorporates the field-scale (micro) roughness as well as topographic (macro) roughness. The performance of the model is evaluated by inverting the traditional tau-omega model for retrieving SM. The study focuses on the passive active L-band system (PALS) radiometer data collected as a part of two Soil Moisture Active Passive Validation Experiment (SMAPVEX), i.e., SMAPVEX12 (humid Manitoba, Canada) and SMAPVEX15 (semiarid Arizona, USA) with highly different microroughness and macroroughness. The measured surface roughness is observed to increase exponentially with clay fraction (CF). This behavior is minimized with increase in leaf area index (LAI). In the absence of vegetation, the contribution of topography toward surface roughness increases. A higher surface roughness value is estimated for SMAPVEX12, which positively correlate with LAI and CF and negatively correlate with wetness conditions. On the other hand, due to the high topographic variability in SMAPVEX15 region, the contribution of topography (surface curvature) toward total surface roughness is significant. Also, consistently dry SM resulted in high microroughness for SMAPVEX15. Nevertheless, a total surface roughness estimated for SMAPVEX15 region is less than for SMAPVEX12. The surface roughness formulation presented in this study can be extrapolated to any spatial resolution.

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