Microwave dielectric properties of Ca1-xSrxMgSi2O6 ceramics

The influences of Sr2+ doping on microwave dielectric properties of Ca1-xSrxMgSi2O6 (x = 0-0.06) ceramics were researched in the work. The intrinsic mechanism responsible for the dielectric properties was explored by the P-V-L theory and Raman spectra. X-ray diffraction revealed that Ca1-xSrxMgSi2O6 solid solutions were formed when x = 0.02-0.06. The epsilon(r) continually increased with an increasing x value, which was related to the average bond ionicity and dielectric polarizability. The change of Qf was due to the variation in Si-O bond. The tau(f) was affected by the Ca/Sr-O bond energy. Furthermore, the Ca(0.9)6Sr(0.04)MgSi(2)O(6) ceramic sintered at 1320 degrees C possessed optimum dielectric properties (epsilon(r) = 8.17, Qf = 85858 GHz, and tau(f) = -41.25 ppm/degrees C).