Journal
ACS APPLIED MATERIALS & INTERFACES
Volume 12, Issue 33, Pages 37757-37763Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acsami.0c10545
Keywords
SrRuO3 thin film; chiral spin structure; topological Hall effect; skyrmion; resonant soft X-ray scattering
Funding
- US Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-AC02-76SF00515]
- research program of Institute for Basic Science [IBS-R009-G2]
- National Research Foundation of Korea [IBS-R009-D1-2020-A00] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
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SrRuO3 (SRO) thin films and their heterostructure have attracted much attention because of the recently demonstrated fascinating properties, such as topological Hall effect and skyrmions. Critical to the understanding of those SRO properties is the study of the spin configuration. Here, we conduct resonant soft X-ray scattering (RSXS) at the oxygen K edge to investigate the spin configuration of a four-unit-cell SRO film that was grown epitaxially on a single-crystal SrTiO3. The RSXS signal under a magnetic field (similar to 0.4 tesla) clearly shows a magnetic dichroism pattern around the specular reflection. Model calculations on the RSXS signal demonstrate that the magnetic dichroism pattern originates from a Neel-type chiral spin structure in this SRO thin film. We believe that the observed spin structure of the SRO system is a critical piece of information for understanding its intriguing magnetic and transport properties.
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