Journal
IEEE WIRELESS COMMUNICATIONS LETTERS
Volume 9, Issue 3, Pages 394-397Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LWC.2019.2957221
Keywords
Stochastic geometry; Matern cluster process; contact distance; nearest-neighbor distance
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This letter provides exact characterization of the contact and nearest-neighbor distance distributions for the ${n}$ -dimensional ( ${n}$ -D) Matern cluster process (MCP). We also provide novel upper and lower bounds to these distributions in order to gain useful insights about their behavior. The two and three dimensional versions of these results are directly applicable to the performance analyses of wireless networks modeled as MCP.
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