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Review of GaN Thin Film and Nanorod Growth Using Magnetron Sputter Epitaxy

Journal

APPLIED SCIENCES-BASEL
Volume 10, Issue 9, Pages -

Publisher

MDPI
DOI: 10.3390/app10093050

Keywords

gallium nitride; magnetron sputter epitaxy; sputtering

Funding

  1. Energimyndigheten
  2. Vetenskapsradet [2018-04198]
  3. Stiftelsen Olle Engkvist Byggmastare [197-0210]
  4. Swedish Government Strategic Research Area in Materials Science on Functional Materials at Linkoping University [SFO-Mat-LiU 2009-00971]
  5. Swedish Research Council [2018-04198] Funding Source: Swedish Research Council

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Magnetron sputter epitaxy (MSE) offers several advantages compared to alternative GaN epitaxy growth methods, including mature sputtering technology, the possibility for very large area deposition, and low-temperature growth of high-quality electronic-grade GaN. In this article, we review the basics of reactive sputtering for MSE growth of GaN using a liquid Ga target. Various target biasing schemes are discussed, including direct current (DC), radio frequency (RF), pulsed DC, and high-power impulse magnetron sputtering (HiPIMS). Examples are given for MSE-grown GaN thin films with material quality comparable to those grown using alternative methods such as molecular-beam epitaxy (MBE), metal-organic chemical vapor deposition (MOCVD), and hydride vapor phase epitaxy (HVPE). In addition, successful GaN doping and the fabrication of practical devices have been demonstrated. Beyond the planar thin film form, MSE-grown GaN nanorods have also been demonstrated through self-assembled and selective area growth (SAG) method. With better understanding in process physics and improvements in material quality, MSE is expected to become an important technology for the growth of GaN.

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