Related references
Note: Only part of the references are listed.Evaluation of residual aberration in fifth-order geometrical aberration correctors
Shigeyuki Morishita et al.
MICROSCOPY (2018)
Deciphering chemical order/disorder and material properties at the single-atom level
Yongsoo Yang et al.
NATURE (2017)
Implications of X-ray thermal diffuse scattering in integrated Bragg intensities of silicon and cubic boron nitride
Nanna Wahlberg et al.
JOURNAL OF APPLIED CRYSTALLOGRAPHY (2017)
Single atom visibility in STEM optical depth sectioning
Ryo Ishikawa et al.
APPLIED PHYSICS LETTERS (2016)
Three-dimensional coordinates of individual atoms in materials revealed by electron tomography
Rui Xu et al.
NATURE MATERIALS (2015)
Large-angle illumination STEM: Toward three-dimensional atom-by-atom imaging
Ryo Ishikawa et al.
ULTRAMICROSCOPY (2015)
Resolving 45-pm-separated Si-Si atomic columns with an aberration-corrected STEM
Hidetaka Sawada et al.
MICROSCOPY (2015)
Development of a monochromator for aberration-corrected scanning transmission electron microscopy
Masaki Mukai et al.
MICROSCOPY (2015)
Three-Dimensional Location of a Single Dopant with Atomic Precision by Aberration-Corrected Scanning Transmission Electron Microscopy
Ryo Ishikawa et al.
NANO LETTERS (2014)
Vibrational spectroscopy in the electron microscope
Ondrej L. Krivanek et al.
NATURE (2014)
Determination of the 3D shape of a nanoscale crystal with atomic resolution from a single image
C. L. Jia et al.
NATURE MATERIALS (2014)
Functional Complex Point-Defect Structure in a Huge-Size-Mismatch System
Ryo Ishikawa et al.
PHYSICAL REVIEW LETTERS (2013)
Three-Dimensional Imaging of Individual Dopant Atoms in SrTiO3
Jinwoo Hwang et al.
PHYSICAL REVIEW LETTERS (2013)
Measurement of chromatic aberration in STEM and SCEM by coherent convergent beam electron diffraction
C. L. Zheng et al.
ULTRAMICROSCOPY (2013)
Three-dimensional atomic imaging of crystalline nanoparticles
Sandra Van Aert et al.
NATURE (2011)
Single dopants in semiconductors
Paul M. Koenraad et al.
NATURE MATERIALS (2011)
Correction of higher order geometrical aberration by triple 3-fold astigmatism field
Hidetaka Sawada et al.
JOURNAL OF ELECTRON MICROSCOPY (2009)
Atomic-scale imaging of individual dopant atoms in a buried interface
N. Shibata et al.
NATURE MATERIALS (2009)
A Bloch wave analysis of optical sectioning in aberration-corrected STEM
E. C. Cosgriff et al.
ULTRAMICROSCOPY (2007)
Synthesis of high-purity boron nitride single crystals under high pressure by using Ba-BN solvent
T. Taniguchi et al.
JOURNAL OF CRYSTAL GROWTH (2007)
Depth sectioning with the aberration-corrected scanning transmission electron microscope
AY Borisevich et al.
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA (2006)
Three-dimensional imaging of individual hafnium atoms inside a semiconductor device
K van Benthem et al.
APPLIED PHYSICS LETTERS (2005)
Atomic-scale imaging of individual dopant atoms and clusters in highly n-type bulk Si
PM Voyles et al.
NATURE (2002)
Appearance of n-type semiconducting properties of cBN single crystals grown at high pressure
T Taniguchi et al.
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS (2002)
Share Paper
