Journal
IEEE JOURNAL OF PHOTOVOLTAICS
Volume 10, Issue 3, Pages 844-851Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPHOTOV.2020.2972356
Keywords
Circuit faults; Impedance; Photovoltaic systems; Time-domain analysis; Degradation; Wires; Accelerated degradation faults (ADF); arc faults (AF); bypass diode faults (BDF); connection faults (CF); degradation; ground faults (GF); open-circuit (OC) faults; photovoltaic (PV) cells; reflectometry; shading faults; short-circuit (SC) faults; spread spectrum time domain reflectometry (SSTDR)
Funding
- U.S. Department of Energy'sOffice of Energy Efficiency and Renewable Energy under Solar Energy Technologies Office [underAgreementDE-EE0008169]
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Spread spectrum time domain reflectometry (SSTDR) is a broadband electrical reflectometry technique that has been used to detect and locate faults on live electrical systems, including photovoltaic systems. In this article, we evaluate the detectability and localizability from both existing literature and our own measurements using SSTDR of open-circuit faults, connection faults, short-circuit faults, ground faults, arc faults, shading faults, bypass diode faults, and accelerated degradation faults in PV cells and mini-modules. Reflection magnitudes for these faults are compared. Preliminary data on buried and grounded PV cable along with arc fault detection are presented.
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