Fast reconstruction of atomic -scale STEM -EELS images from sparse sampling ?

This paper discusses the reconstruction of partially sampled spectrum -images to accelerate the acquisition in scanning transmission electron microscopy (STEM). The problem of image reconstruction has been widely considered in the literature for many imaging modalities, but only a few attempts handled 3D data such as spectral images acquired by STEM electron energy loss spectroscopy (EELS). Besides, among the methods pro- posed in the microscopy literature, some are fast but inaccurate while others provide accurate reconstruction but at the price of a high computation burden. Thus none of the proposed reconstruction methods fulfills our ex- pectations in terms of accuracy and computation complexity. In this paper, we propose a fast and accurate reconstruction method suited for atomic -scale EELS. This method is compared to popular solutions such as beta process factor analysis (BPFA) which is used for the first time on STEM -EELS images. Experiments based on real as synthetic data will be conducted.