Journal
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA
Volume 117, Issue 20, Pages 10654-10659Publisher
NATL ACAD SCIENCES
DOI: 10.1073/pnas.1921713117
Keywords
electronic nematicity; strontium ruthenate; molecular-beam epitaxy; angle-resolved transverse resistivity
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Funding
- US Department of Energy, Basic Energy Sciences, Materials Sciences and Engineering Division
- Gordon and Betty Moore Foundation's EPiQS Initiative Grant [GBMF9074]
- National Science Foundation [DMR-1539918]
- W.M. Keck Foundation
- National Science Foundation Graduate Research Fellowship Program [DGE-1650441]
- Gordon and Betty Moore Foundation [GBMF9073]
- NSF [ECCS-1542081]
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We have measured the angle-resolved transverse resistivity (ARTR), a sensitive indicator of electronic anisotropy, in high-quality thin films of the unconventional superconductor Sr2RuO4 grown on various substrates. The ARTR signal, heralding the electronic nematicity or a large nematic susceptibility, is present and substantial already at room temperature and grows by an order of magnitude upon cooling down to 4 K. In Sr2RuO4 films deposited on tetragonal substrates the highest-conductivity direction does not coincide with any crystallographic axis. In films deposited on orthorhombic substrates it tends to align with the shorter axis; however, the magnitude of the anisotropy stays the same despite the large lattice distortion. These are strong indications of actual or incipient electronic nematicity in Sr2RuO4.
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