4.6 Article

Epitaxial single-crystal rare-earth oxide in horizontal slot waveguide for silicon-based integrated active photonic devices

Journal

OPTICS EXPRESS
Volume 28, Issue 10, Pages 14448-14460

Publisher

OPTICAL SOC AMER
DOI: 10.1364/OE.389765

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Funding

  1. Japan Society for the Promotion of Science [KAKENHI 19H02207, KAKENHI 19H02636]

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We have epitaxially grown high-quality single-crystal rare-earth oxide thin films, including Gd2O3 and erbium-incorporated (ErGd)(2)O-3, on silicon-on-insulator substrate, and investigated their optical properties when embedded in horizontal slot waveguides. (ErGd)(2)O-3 with an erbium concentration in the mid-10(21) cm(-3) range shows well-resolved Stark-split photoluminescence emission peaks in the telecommunications band and a photoluminescence lifetime-concentration product as large as 2.67 x 10(18) s.cm(-3) at room-temperature. Using these materials, horizontal slot waveguides with strong optical confinement in low-refractive-index rare-earth oxide layers, have been fabricated for silicon-based integrated active photonic devices. Thanks to the strong light-matter interaction, a large waveguide modal absorption of 88 dB/cm related to erbium ions is achieved, leading to a large potential optical gain. Intense emissions from the waveguides are also observed, with a radiation efficiency on the order of 10(-4). These results indicate that a combination of epitaxial rare-earth oxide thin films and horizontal slot waveguides provides a promising platform for light amplification and generation on silicon. (c) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

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