Nonlinear optical study of Schiff bases using Z-scan technique

Three Schiff bases dissolved in chloroform were investigated to determine their nonlinear optical properties using D4 sigma Z-scan technique employing 10 ps pulses of Nd:YAG laser at 355 nm. It was found that the highest value of the nonlinear refractive index was obtained for Schiff base with 2-(2-pyridyl)ethylamine. Whereas, a negative nonlinear refractive index was extracted for symmetrical Schiff base with cyclohexanediamine with NO2 group. In addition, the Schiff base thin films were investigated using AFM and SEM/EDX measurements to check their quality and homogeneity, which is necessary in the production of photonic devices.