4.6 Article

Variational-state quantum metrology

Journal

NEW JOURNAL OF PHYSICS
Volume 22, Issue 8, Pages -

Publisher

IOP Publishing Ltd
DOI: 10.1088/1367-2630/ab965e

Keywords

quantum algorithms; quantum information processing; quantum metrology; quantum sensing; quantum simulation

Funding

  1. EPSRC Hub Grants [EP/M013243/1, EP/T001062/1]
  2. IARPA
  3. EU [820495, H2020-FETFLAG-03-2018]
  4. Japan Student Services Organization (JASSO) Student Exchange Support Programme (Graduate Scholarship for Degree Seeking Students)
  5. Leading Initiative for Excellent Young Researchers MEXT Japan
  6. MEXT KAKENHI [15H05870]

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Quantum technologies exploit entanglement to enhance various tasks beyond their classical limits including computation, communication and measurements. Quantum metrology aims to increase the precision of a measured quantity that is estimated in the presence of statistical errors using entangled quantum states. We present a novel approach for finding (near) optimal states for metrology in the presence of noise, using variational techniques as a tool for efficiently searching the high-dimensional space of quantum states, which would be classically intractable. We comprehensively explore systems consisting of up to 9 qubits and find new highly entangled states that are not symmetric under permutations and non-trivially outperform previously known states up to a constant factor 2. We consider a range of environmental noise models; while passive quantum states cannot achieve a fundamentally superior scaling (as established by prior asymptotic results) we do observe a significant absolute quantum advantage. We finally outline a possible experimental setup for variational quantum metrology which can be implemented in near-term hardware.

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