4.6 Article

New approach for the molecular beam epitaxy growth of scalable WSe2 monolayers

Journal

NANOTECHNOLOGY
Volume 31, Issue 25, Pages -

Publisher

IOP PUBLISHING LTD
DOI: 10.1088/1361-6528/ab80fe

Keywords

2D materials; molecular beam epitaxy; electron microscopy; atomic force microscopy; x-ray diffraction

Funding

  1. Agence nationale de la recherche ANR-MAGICVALLEY [ANR-18-CE24-0007]
  2. LANEF framework [ANR-10-LABX-5101]
  3. Agence Nationale de la Recherche (ANR) [ANR-18-CE24-0007] Funding Source: Agence Nationale de la Recherche (ANR)

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The search for high-quality transition metal dichalcogenides mono- and multi-layers grown on large areas is still a very active field of investigation. Here, we use molecular beam epitaxy to grow WSe2 on 15 x 15 mm large mica in the van der Waals regime. By screening one-step growth conditions, we find that very high temperature (>900 degrees C) and very low deposition rate (<0.15 angstrom min(-1)) are necessary to obtain high quality WSe2 films. The domain size can be as large as 1 mu m and the in-plane rotational misorientation of 1.25 degrees. The WSe2 monolayer is also robust against air exposure, can be easily transferred over 1 cm(2) on SiN/SiO2 and exhibits strong photoluminescence signal. Moreover, by combining grazing incidence x-ray diffraction and transmission electron microscopy, we could detect the presence of few misoriented grains. A two-dimensional model based on atomic coincidences between the WSe2 and mica crystals allows us to explain the formation of these misoriented grains and gives insight to achieve highly crystalline WSe2.

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