4.8 Article

Inter- and Intragrain Inhomogeneity in 2D Perovskite Thin Films Revealed by Relative Grain Orientation Imaging Using Low-Frequency Polarized Raman Microspectroscopy

Journal

JOURNAL OF PHYSICAL CHEMISTRY LETTERS
Volume 11, Issue 10, Pages 3871-3876

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acs.jpclett.0c00992

Keywords

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Funding

  1. JSPS KAKENHI [JP19H02821, JP18J20312]
  2. Ministry of Science and Technology, Taiwan [MOST108-2119-M009-004]
  3. Center for Emergent Functional Matter Science of National Chiao Tung University from The Featured Areas Research Center Program within the framework of the Higher Education SPROUT Project, Ministry of Education (MOE) in Taiwan
  4. Kawanishi Memorial ShinMaywa Education Foundation

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Two-dimensional (2D) organic-inorganic hybrid lead halide perovskites make up an emerging class of semiconductor materials for optoelectronic applications such as solar cells. The grain structure of polycrystalline 2D perovskites is one of the key factors that dictate their functionality in the devices, but currently available methods for in situ, chemically specific characterization of 2D perovskite grains are scarce. Here we show that ultra-low-frequency polarized Raman microspectroscopy is a facile yet powerful tool for visualizing relative grain orientations within 2D perovskite thin films. We demonstrate this method on the simplest 2D perovskite, (CH3(CH2)(3)NH3)(2)PbI4. Hierarchical clustering and detailed band decomposition analysis of the low-frequency polarized Raman imaging data reveal not only relative grain orientations but also intragrain inhomogeneity. We envisage that with high chemical specificity, this method will find broad applications ranging from other 2D perovskites to perovskite-based optoelectronic devices.

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