4.7 Article

A Quasi-DC Potential Drop Measurement System for Material Testing

Journal

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume 69, Issue 4, Pages 1313-1326

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIM.2019.2908509

Keywords

Cracks; creep; electrical resistance measurement; fatigue; voltage measurement

Funding

  1. U.K. Engineering and Physical Sciences Research Council via the U.K. Research Center in NDE [EP/K503733/1, EP/L022125/1]
  2. EPSRC [EP/L022125/1] Funding Source: UKRI

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Potential drop (PD) measurements are well established for use in materials testing and are commonly used for crack growth and strain monitoring. Traditionally, the experimenter has a choice between employing direct current (dc) or alternating current (ac), both of which have strengths and limitations. The dc measurements are afflicted by competing spurious dc signals and, therefore, require large measurement currents (tens or hundreds of amperes) to improve the signal-to-noise ratio, which in turn leads to the significant resistive Joule heating. The ac measurements have superior noise performance due to the utilization of phase-sensitive detection and a lower spectral noise density but are subject to the skin effect and are, therefore, not well suited to high-accuracy scientific studies of ferromagnetic materials. In this paper, a quasi-dc monitoring system is presented which uses very low-frequency (0.3-30-Hz) current which combines the positive attributes of both dc and ac while mitigating the negatives. Bespoke equipment has been developed that is capable of low-noise measurements in the demanding quasi-dc regime. A creep crack growth test and fatigue test are used to compare noise performance and measurement power against alternative DCPD equipment. The combination of the quasi-dc methodology and the specially designed electronics yields exceptionally low-noise measurements using typically 100-400 mA; at 400 mA, the quasi-dc system achieves a 13-fold improvement in signal-to-noise ratio compared to a 25-A dc system. The reduction in measurement current from 25 A to 400 mA represents a similar to 3900-fold reduction in measurement power, effectively eliminating resistive heating and enabling much simpler experimental arrangements.

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