Journal
CERAMICS INTERNATIONAL
Volume 42, Issue 2, Pages 2676-2685Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.ceramint.2015.10.096
Keywords
Thin Films; Optical constants; Spectrophotometry; Spectroscopic ellipsometry
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Funding
- UGC, New Delhi, India [42-856/2013(SR)]
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Zinc telluride (ZnTe) and zinc sulfide (ZnS) thin films were deposited onto glass substrates by the thermal evaporation technique. Their structural characteristics were studied by X-ray diffraction (XRD). XRD showed that both ZnTe and ZnS films are polycrystalline with a zinc blende (cubic) structure. The optical constants (n, k), and film thickness (d) of ZnTe and ZnS thin films were obtained using two methods, first was based on transmission (7) curve obtained by spectrophotometer (SM), using envelope method suggested by Swanepoel and the second was dependent on the ellipsometric parameters (psi and Delta) obtained by spectroscopic ellipsometry (SE), using three layer model systems. Both the film thickness and refractive index obtained through these two methods are comparable. The optical band gap was calculated in terms of SE in strong absorption region. The possible optical transition in these films is found to be allowed direct transitions. The increase of E-g(opt) for both ZnTe and ZnS thin films may be the contributing factor in the increase of crystallites size and decrease in lattice strain. (C) 2015 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
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