Journal
APPLIED PHYSICS LETTERS
Volume 116, Issue 18, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/5.0009670
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Funding
- U.S. Department of Energy, Office of Science, Basic Energy Sciences [DE-SC0010324]
- U.S. Department of Energy (DOE) [DE-SC0010324] Funding Source: U.S. Department of Energy (DOE)
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Memristor devices have history-dependent charge transport properties that are ideal for neuromorphic computing applications. We reveal a memristor material and mechanism in the layered Mott insulator alpha -RuCl3. The pinched hysteresis loops and S-shaped negative differential resistance in bulk crystals verify memristor behavior and are attributed to a nonlinear coupling between charge injection over a Schottky barrier at the electrical contacts and concurrent Joule heating. Direct simulations of this coupling can reproduce the device characteristics.
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