4.3 Article

Magnetic impurities as the origin of the variability in spin relaxation rates in Cu-based spin transport devices

Journal

PHYSICAL REVIEW MATERIALS
Volume 3, Issue 12, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevMaterials.3.124409

Keywords

-

Funding

  1. National Science Foundation [DMR-1807124]
  2. NSF through the MSREC program
  3. NSF through the National Nano Coordinated Infrastructure Network [NNCI-1542202]
  4. UK EPSRC [EP/P005713/1]
  5. EPSRC [EP/P005713/1] Funding Source: UKRI

Ask authors/readers for more resources

The Elliott-Yafet spin relaxation mechanism posits linear proportionality between spin and momentum lifetimes in low spin-orbit coupling nonmagnetic metals, and is widely accepted in spintronics. Accurate experimental determination of the Elliott-Yafet proportionality constants (beta(i)) between the spin and momentum relaxation times for individual scattering sources is challenging, however. This is apparent from the literature on nonlocal spin transport in Cu, for example, where reported phonon (beta(ph)) and defect (beta(def)) Elliott-Yafet constants vary by an order of magnitude. In recent work we discovered that even part-per-million-level magnetic impurity concentrations can substantially influence spin relaxation in Cu, via a spin transport analog of the Kondo effect. To clarify whether this could explain the reported variability in beta(i), here we report on a comprehensive study of spin transport in Cu-based lateral nonlocal spin valves, varying the ferromagnetic contact material, interface structure, Cu thickness, and post-fabrication annealing conditions, resulting in widely varied microstructures and magnetic impurity concentrations. Quantifying the effects of magnetic impurities on charge and spin transport we demonstrate the dramatic, even dominant, effect these can have on spin relaxation rates, and thus extracted beta(i). Minimization of magnetic impurity effects is achieved via Al interlayer insertion or moderate annealing, restoring the expected temperature dependence for phonon-mediated spin relaxation, and enabling more reliable determination of beta(i) for phonons (740 +/- 200), and nonmagnetic defects (240 +/- 50). The latter contribution is shown to be dominated by grain boundaries in these polycrystalline Cu films. Cross-sectional transmission electron microscopy measurement of grain sizes in actual nonlocal spin valve devices then establishes a useful empirical relationship between average grain size and spin diffusion length. These measurements highlight the importance of magnetic impurities in metallic spin transport, explain the wide variability in reported beta(ph) and beta(def) in Cu, and elucidate the relationship between metallic spin transport and microstructure.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.3
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available