4.8 Article

Ultrashort Vertical-Channel van der Waals Semiconductor Transistors

Journal

ADVANCED SCIENCE
Volume 7, Issue 4, Pages -

Publisher

WILEY
DOI: 10.1002/advs.201902964

Keywords

2D nanoelectronics; ultrashort channel; van der Waals semiconductors; vertical type transistors

Funding

  1. Institute for Basic Science of Korea [IBS-R011-D1]
  2. National Research Foundation of Korea (NRF) [NRF-2018M3D1A1058793]
  3. National Research Foundation of Korea [IBS-R011-D1-2020-A00] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

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Atomically thin 2D van der Waals semiconductors are promising candidates for next-generation nanoscale field-effect transistors (FETs). Although large-area 2D van der Waals materials have been successfully synthesized, such nanometer-length-scale devices have not been well demonstrated in 2D van der Waals semiconductors. Here, controllable nanometer-scale transistors with a channel length of approximate to 10 nm are fabricated via vertical channels by squeezing an ultrathin insulating spacer between the out-of-plane source and drain electrodes, and the feasibility of high-density and large-scale fabrication is demonstrated. A large on-current density of approximate to 70 mu A mu m(-1) nm(-1) at a source-drain voltage of 0.5 V and a high on/off ratio of approximate to 10(7)-10(9) are obtained in ultrashort 2D vertical channel FETs with monolayer MoS2 synthesized through chemical vapor deposition. The work provides a promising route toward the complementary metal-oxide-semiconductor-compatible fabrication of wafer-scale 2D van der Waals transistors with high-density integration.

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