4.8 Review

Quasi van der Waals epitaxy nitride materials and devices on two dimension materials

Journal

NANO ENERGY
Volume 69, Issue -, Pages -

Publisher

ELSEVIER
DOI: 10.1016/j.nanoen.2020.104463

Keywords

Quasi-van der Waals epitaxy; Nitride films; 2D materials; Nucleation mechanism; Nitride-based devices

Funding

  1. National Key RAMP
  2. D Program of China [2018YFB0406700]
  3. National Natural Science Foundation of China [61974139, 61527814]
  4. Beijing Natural Science Foundation [4182063]

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In recent years, a novel epitaxial method based on Quasi-van der Waals (QvdW) force to epitaxy three-dimensional (3D) nitride semiconductors on two-dimensional (2D) materials opens a new application space for nitride-based devices, including optoelectronic and power electronic applications. Sp(2)-bonded 2D materials with hexagonal in-plane lattice arrangements and weakly bonded layers can relax the strict requirements of the lattice and thermal mismatches between nitrides and heteroepitaxial substrates. Furthermore, it also allows transferring nitride devices to arbitrary substrates due to weak vdW interaction between 2D materials and nitride overlying layers. In this review, we will focus on the recent progress in the growth of nitrides film and devices on different kinds of 2D materials. The fundamental challenges and the nucleation mechanism on 2D materials are presented by introducing a high density of surface defects. The different functional applications of 2D materials on nitride materials and devices are also discussed in detail. Through the paper, we exhibit the up-to-date state in this field of research and present future perspectives regarding the development of nitride on 2D materials.

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