Journal
ADVANCED ENERGY MATERIALS
Volume 10, Issue 26, Pages -Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/aenm.201903781
Keywords
carrier diffusion; grain boundaries; hot carrier transport; hybrid perovskites; ultrafast microscopy
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Funding
- National Science Foundation [NSF-DMR-1507803]
- U.S. Department of Energy, Office of Basic Energy Sciences [DE-SC0016356]
- U.S. Department of Energy (DOE) [DE-SC0016356] Funding Source: U.S. Department of Energy (DOE)
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In this review, the recent progress in using transient absorption microscopy to image charge transport and dynamics in semiconducting hybrid organic-inorganic perovskites is discussed. The basic principles, instrumentation, and resolution of transient absorption microscopy are outlined. With temporal resolution as high as 10 fs, sub-diffraction-limit spatial resolution, and excited-state structural resolution, these experiments have provided crucial details on charge transport mechanisms that have been previously obscured in conventional ultrafast spectroscopy measurements. Morphology-dependent mapping unveils spatial heterogeneity in carrier recombination and cooling dynamics. By spatially separating the pump and probe beams, carrier transport across grain boundaries has been directly visualized. Further, femtosecond temporal resolution allows for the examination of nonequilibrium transport directly, revealing extraordinarily long-range hot carrier migration. The application of transient absorption microscopy is not limited to hybrid perovskites but can also be useful for other polycrystalline materials in which morphology plays an important role in carrier transport.
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