Journal
NATURE PHOTONICS
Volume 14, Issue 4, Pages 245-+Publisher
NATURE PUBLISHING GROUP
DOI: 10.1038/s41566-019-0566-4
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Funding
- World Class Institute (WCI) Program of the National Research Foundation of Korea (NRF) - Ministry of Science, ICT and Future Planning (NRF) [WCI 2011-001]
- internal R&D programme at KAERI - Ministry of Science and ICT (MSIT) of the Republic of Korea [525350-19]
- University of Science and Technology (UST) UST Young Scientist Research Program, through the University of Science and Technology [2017-YS-06]
- National Research Council of Science & Technology (NST) - Korea government (MSIT) [CAP-18-05-KAERI]
- Swiss National Science Foundation (SNSF) [200020-178812]
- Swiss National Science Foundation (SNF) [200020_178812] Funding Source: Swiss National Science Foundation (SNF)
- National Research Council of Science & Technology (NST), Republic of Korea [CAP-18-05-KAERI, 525350-19] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
- National Research Foundation of Korea [21A20131100002] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
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An ultrafast electron diffraction facility with an overall temporal resolution of 31 fs root mean square is developed. Even for a charge as high as 0.6 pC, the electron bunch duration and timing jitter are 25 fs and less than 10 fs, respectively. Stroboscopic visualization of nuclear or electron dynamics in atoms, molecules or solids requires ultrafast pump and probe pulses and a close to perfect synchronization between the two. We have developed a 3 MeV ultrafast electron diffraction (UED) probe technology that nominally reduces the electron bunch duration and the arrival time jitter to the subfemtosecond level. This simple configuration uses a radiofrequency photogun and a 90 degrees achromatic bend and is designed to provide effectively jitter-free conditions. Terahertz streaking measurements reveal an electron bunch duration of 25 fs, even for a charge as high as 0.6 pC, and an arrival time jitter of 7.8 fs, the latter limited by only the measurement accuracy. From pump-probe measurements of photoexcited bismuth films, the instrument response function was determined to be 31 fs. This pioneering jitter-free technique paves the way towards UED of attosecond phenomena in atomic, molecular and solid-state dynamics.
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