4.8 Article

Graphene-assisted spontaneous relaxation towards dislocation-free heteroepitaxy

Journal

NATURE NANOTECHNOLOGY
Volume 15, Issue 4, Pages 272-+

Publisher

NATURE PUBLISHING GROUP
DOI: 10.1038/s41565-020-0633-5

Keywords

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Funding

  1. Defense Advanced Research Projects Agency Young Faculty Award [029584-00001]
  2. Department of Energy Solar Energy Technologies Office [DE-EE0008558]
  3. Air Force Research Laboratory [FA9453-18-2-0017]
  4. National Science Foundation Division of Material Research [1719875]
  5. ROHM Co.
  6. LG electronics

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Although conventional homoepitaxy forms high-quality epitaxial layers(1-5), the limited set of material systems for commercially available wafers restricts the range of materials that can be grown homoepitaxially. At the same time, conventional heteroepitaxy of lattice-mismatched systems produces dislocations above a critical strain energy to release the accumulated strain energy as the film thickness increases. The formation of dislocations, which severely degrade electronic/photonic device performances(6-8), is fundamentally unavoidable in highly lattice-mismatched epitaxy(9-11). Here, we introduce a unique mechanism of relaxing misfit strain in heteroepitaxial films that can enable effective lattice engineering. We have observed that heteroepitaxy on graphene-coated substrates allows for spontaneous relaxation of misfit strain owing to the slippery graphene surface while achieving single-crystalline films by reading the atomic potential from the substrate. This spontaneous relaxation technique could transform the monolithic integration of largely lattice-mismatched systems by covering a wide range of the misfit spectrum to enhance and broaden the functionality of semiconductor devices for advanced electronics and photonics. The spontaneous relaxation of misfit strain achieved on graphene-coated substrates enables the growth of heteroepitaxial single-crystalline films with reduced dislocation density.

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