4.5 Article

Change of exposure time mid-test in high temperature DIC measurement

Journal

MEASUREMENT SCIENCE AND TECHNOLOGY
Volume 31, Issue 7, Pages -

Publisher

IOP Publishing Ltd
DOI: 10.1088/1361-6501/ab7bbf

Keywords

DIC; extreme temperature; exposure time; ultraviolet light; graphite; Gleeble

Funding

  1. NASA's Marshall Space Flight Center [80MSFC18M0009]
  2. Utah State University Office of Research and Graduate Studies

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Performing digital image correlation (DIC) at extreme temperatures has been greatly challenging due to the radiation which saturates the camera sensor. At such high temperatures, the light intensity emitted from an object is occasionally so powerful that the acquired images are overwhelmingly saturated. This induces data loss, potentially ruining the test, thus requiring the user to restart the test. For this reason, selection of an appropriate camera sensitivity plays a crucial role prior to beginning the test. Exposure time is a factor contributing to camera sensitivity and it is the easiest setting to manipulate during the test since it introduces minimal errors when comparing to other factors, especially in quasi-static tests. This paper examines the influence of changing exposure time mid-test on DIC measurement uncertainty. The investigation was conducted by rigid body motion experiments at room temperature and 1600 degrees C, respectively. Thereby, some recommendations are given to help DIC users assess their images at room temperature to extrapolate the exposure at extreme temperatures along with accompanying solutions to salvage data at high temperature.

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