Journal
IEEE-ASME TRANSACTIONS ON MECHATRONICS
Volume 25, Issue 1, Pages 418-428Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMECH.2019.2947203
Keywords
Surfaces; Actuators; Imaging; Spirals; IEEE transactions; Mechatronics; Trajectory; Adaptive scan; atomic force microscopy (AFM); optimal control
Categories
Funding
- Australian Research Council
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Constant-force contact-mode atomic force microscopy (AFM) relies on a feedback control system to regulate the tip-sample interaction during imaging. Due to limitations in actuators and control, the bandwidth of the regulation system is typically small. Therefore, the scan rate is usually limited in order to guarantee a desirable image quality for a constant-rate scan. By adapting the scan rate online, further performance improvement is possible, and the conditions to this improvement have been explored qualitatively in a previous study for a wide class of possible scan patterns. In this article, a quantitative assessment of the previously proposed adaptive scan scheme is investigated through experiments that explore the impact of various degrees of freedom in the algorithm. Further modifications to the existing scheme are proposed and shown to improve the closed-loop performance. The flexibility of the proposed approach is further demonstrated by applying the algorithm to tapping-mode AFM.
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