Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 67, Issue 1, Pages 63-70Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNS.2019.2961801
Keywords
Dosimetry; ion beams; ion beam applications; lead; radiation effects
Ask authors/readers for more resources
Single event effect (SEE) testing with ultrahigh energy (UHE) heavy ions, such as the beams provided at CERN, presents advantages related to their long ranges with a constant linear energy transfer value. In the present work, the possibility to test components in parallel is being examined, and results from the CERN 2018 UHE Pb test campaigns are studied. Furthermore, the generation of multibit upsets by the UHE Pb ions is evaluated, and the contribution of possible fragments to the SEE measurements is discussed.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available
Share Paper
