4.6 Article

Reduction of Beam Squinting and Cross-Polarized Fields in a Wideband CP Element

Journal

IEEE ANTENNAS AND WIRELESS PROPAGATION LETTERS
Volume 19, Issue 3, Pages 418-422

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LAWP.2020.2968406

Keywords

Broadband; circular polarization; defected ground structure (DGS); microstrip antenna; pattern symmetry

Funding

  1. Centre of Advanced Study in Radio Physics and Electronics, University of Calcutta, India

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Achieving wide circularly polarized (CP) bandwidth in a simple probe-fed microstrip antenna is essential for many practical applications. Existing knowledge guides exploring a thick substrate-based patch design. However, it suffers from two major inherent issues: squinting of beam and high cross-polarized (XP) radiation. No solution is available so far. This letter successfully addresses both issues by imposing restriction on the fringing characteristics as well as modal fields of a suspended substrate circular patch. Engineered ground plane bearing different strategic defects has been explored leading to about 50% correction in beam squinting with reference to antenna boresight and 2-8 dB reduction in a peak XP level. Realistic design, physical insight, and the experimental validation ensure its huge potential for practical applications.

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