Journal
ADVANCED MATERIALS
Volume 32, Issue 12, Pages -Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.201906942
Keywords
atomically thin materials; giant Stark effect; resonant tunneling spectroscopy; van der Waals heterostructures
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Funding
- Samsung Research Funding & Incubation Center of Samsung Electronics [SRFC-MA1701-01]
- New York University (NYU) Shanghai (Start-Up Funds)
- NYU-ECNU (East China Normal University) Institute of Physics at NYU Shanghai
- Science and Technology Commission of Shanghai Municipality (STCSM) [19ZR1436400]
- National Research Foundation of Korea [NRF- 2019R1F1A1051215]
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Each atomic layer in van der Waals heterostructures possesses a distinct electronic band structure that can be manipulated for unique device operations. In the precise device architecture, the subtle but critical band splits by the giant Stark effect between atomic layers, varied by the momentum of electrons and external electric fields in device operation, has not yet been demonstrated or applied to design original devices with the full potential of atomically thin materials. Here, resonant tunneling spectroscopy based on the negligible quantum capacitance of 2D semiconductors in resonant tunneling transistors is reported. The bandgaps and sub-band structures of various channel materials could be demonstrated by the new conceptual spectroscopy at the device scale without debatable quasiparticle effects. Moreover, the band splits by the giant Stark effect in the channel materials could be probed, overcoming the limitations of conventional optical, photoemission, and tunneling spectroscopy. The resonant tunneling spectroscopy reveals essential and practical information for novel device applications.
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