4.6 Article

Thickness-Dependence Electrical Characterization of the One-Dimensional van der Waals TaSe3 Crystal

Journal

MATERIALS
Volume 12, Issue 15, Pages -

Publisher

MDPI
DOI: 10.3390/ma12152462

Keywords

TaSe3; mechanical exfoliation; work function; van der Waals crystal; scanning Kelvin probing microscopy

Funding

  1. Nano Material Technology Development Program through the National Research Foundation of Korea (NRF) - Ministry of Science and ICT [NRF-2019R1F1A1063170, 2009-0082580]
  2. NRF in Korea [2014R1A6A3A04058169]
  3. National Research Foundation of Korea [2014R1A6A3A04058169] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

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Needle-like single crystalline wires of TaSe3 were massively synthesized using the chemical vapor transport method. Since the wedged-shaped single TaSe3 molecular chains were stacked along the b-axis by weak van der Waals interactions, a few layers of TaSe3 flakes could be easily isolated using a typical mechanical exfoliation method. The exfoliated TaSe3 flakes had an anisotropic planar structure, and the number of layers could be controlled by a repeated peeling process until a monolayer of TaSe3 nanoribbon was obtained. Through atomic force and scanning Kelvin probe microscope analyses, it was found that the variation in the work function with the thickness of the TaSe3 flakes was due to the interlayer screening effect. We believe that our results will not only help to add a novel quasi-1D block for nanoelectronics devices based on 2D van der Waals heterostructures, but also provide crucial information for designing proper contacts in device architecture.

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