A wavelength-dispersive X-ray spectrometer for in/ex situ resonant inelastic X-ray scattering studies

A wavelength-dispersive X-ray spectrometer based on von Hamos geometry for in/ex situ resonant inelastic X-ray scattering (RIXS) studies at BL14W1-X-ray absorption fine structure (XAFS) beamline of Shanghai Synchrotron Radiation Facility (SSRF) is reported. The design considerations and the operational characteristics of the spectrometer are described in detail. With a Si(444) bent crystal, the spectrometer provides an energy range from 8 to 9 keV, which enables the measurement of K-edge X-ray spectroscopy of some transition metal complexes and L-edge X-ray spectroscopy of some 5d transition metal complexes. Based on von Hamos geometry, the process of the collection of RIXS is considerably simplified. The collection of full RIXS planes of tungstic samples requiring spectral resolutions is presented, demonstrating the speciation capabilities of the instrument. Taking the series of oxide-derived copper catalysts for carbon dioxide electrochemical reduction as the research model, the in situ RIXS were measured to probe dynamic changes in electronic structure. Finally, the comparison between in situ RIXS and in situ conventional XAFS is presented, demonstrating more competitive spectral resolution of RIXS.