Journal
OPTICS LETTERS
Volume 44, Issue 20, Pages 4981-4984Publisher
OPTICAL SOC AMER
DOI: 10.1364/OL.44.004981
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Funding
- Engineering and Physical Sciences Research Council [EP/P030017/1]
- Horizon 2020 Framework Programme (BE-OPTICAL) [675512]
- EPSRC [EP/P030017/1] Funding Source: UKRI
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Compressive sensing can overcome the Nyquist criterion and record images with a fraction of the usual number of measurements required. However, conventional measurement bases are susceptible to diffraction and scattering, prevalent in high-resolution microscopy. In this Letter, we explore the random Morlet basis as an optimal set for compressive multi-photon imaging, based on its ability to minimize the space- frequency uncertainty. We implement this approach for wide-field multiphoton microscopy with single-pixel detection, which allows imaging through turbid media without correction. The Morlet basis promises a route for rapid acquisition with lower photodamage. (C) 2019 Optical Society of America
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