Journal
OPTICS EXPRESS
Volume 27, Issue 22, Pages 31644-31666Publisher
OPTICAL SOC AMER
DOI: 10.1364/OE.27.031644
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Funding
- Deutsche Forschungsgemeinschaft (MAP) [LA 3264/2-1]
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The sampling patterns of the light field microscope (LFM) are highly depth-dependent, which implies non-uniform recoverable lateral resolution across depth. Moreover, reconstructions using state-of-the-art approaches suffer from strong artifacts at axial ranges, where the LFM samples the light field at a coarse rate. In this work, we analyze the sampling patterns of the LFM, and introduce a flexible light field point spread function model (LFPSF) to cope with arbitrary LFM designs. We then propose a novel aliasing-aware deconvolution scheme to address the sampling artifacts. We demonstrate the high potential of the proposed method on real experimental data. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
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