Journal
JOURNAL OF PHYSICAL CHEMISTRY A
Volume 123, Issue 50, Pages 10824-10836Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acs.jpca.9b09099
Keywords
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Funding
- National Science Foundation [NSF CHE 1665110]
- Air Force Office of Scientific Research [FA9550-19-1-0093]
- National Science Foundation Graduate Research Fellowship Program [DGE-1747503]
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The dynamics of electronic transitions in solid-state materials are closely linked to microscopic morphology, but it is challenging to simultaneously characterize their spectral and temporal response with high spatial resolution. We present a time-resolved nonlinear microscopy system using white-light supercontinuum pulses as a broadband light source. This system is capable of correlating nanometer scale sample morphology determined from atomic force topography measurements with broadband transient absorption hyperspectral images and ultrafast 2D white-light spectra, all with a spatial resolution of <= 1 mu m. The experimental apparatus is described with a focus on the dispersion management strategies necessary to minimize the duration of optical pulses when implementing an AOM based pulse-shaping system covering a broad-spectral range in the VIS/NIR. Experiments on TIPS-pentacene organic semiconductor microcrystals are used to demonstrate the unique capabilities of this technique.
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