Journal
JOURNAL OF LOW TEMPERATURE PHYSICS
Volume 199, Issue 3-4, Pages 569-576Publisher
SPRINGER/PLENUM PUBLISHERS
DOI: 10.1007/s10909-019-02261-z
Keywords
Athena; X-IFU; TES; FDM
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We present developments in the simulation of transition-edge sensor (TES) microcalorimeters under AC bias for the purpose of detector studies. The presented model extends the TES differential equation system by describing the TES as a resistively shunted junction, using the Josephson equations instead of a parametrized resistance. To demonstrate the performance of this model, we compare simulated and measured IV curves of a pixel characterized for the Athena X-ray Integral Field Unit and showcase the signal generated by a simulated X-ray pulse.
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