Journal
CORROSION SCIENCE
Volume 164, Issue -, Pages -Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.corsci.2019.108319
Keywords
Intermetallic particles; Anodization; SKPFM; In-situ EC-AFM; Operando EIS; Localised dissolution
Funding
- Swedish Foundation for Strategic Research [RMA11-0090]
- Swedish Foundation for Strategic Research (SSF) [RMA11-0090] Funding Source: Swedish Foundation for Strategic Research (SSF)
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Microstructure and Volta-potential analyses were conducted to characterise intermetallic-particles (IMPs) in AA7075-T5. EIS and AFM were applied under operando-conditions to investigate anodisation processes. IMPs have pronounced influence on the growth of anodic aluminium oxide (AAO) films resulting in low charge transfer resistance. Cu-bearing constituents show cathodic-character, whereas Mg2Si and MgZn2 particles show anodic-character. During anodisation, Al7Cu2Fe remain stable with peripheral-dissolution around boundary. De-alloying of S-phase particles leads to the detachment. Mg2Si undergoes de-alloying at low potential, and re-passivation at high potential. MgZn2 dissolves entirely upon anodization. Localised-dissolution in large-IMPs boundaries or nanometre-sized IMPs facilitates bubble evolution, confirming local breakdown of barrier-layer.
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