Journal
APPLIED SURFACE SCIENCE
Volume 493, Issue -, Pages 673-678Publisher
ELSEVIER
DOI: 10.1016/j.apsusc.2019.07.058
Keywords
Graphite; Fe2O3; Ellipsometry; XPS; AFM
Categories
Funding
- Ministry of Education, Youth and Sports of the Czech Republic under the project CEITEC 2020 [LQ1601]
- National Sustainability Program [LO1401]
- Internal Grant Agency of Brno University of Technology [FEKT-S-17-4626]
- CEITEC Nano Research Infrastructure (MEYS CR, 2016-2019)
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Graphite finds use in a large amount of nanoscale applications, including as a substrate for thin film and nanomaterial deposition. With its excellent properties for usage in nanoscale and given the regularity of structure of highly oriented pyrolytic graphite (HOPG), the possibility of use to acquire more precise and detailed results is high. To this end the basic topographical and structural properties of HOPG and thin Fe2O3 have been explored. Methods used were atomic force microscopy, ellipsometry and x-ray photoelectron spectroscopy. Documentation of the results allows for further examination of HOPG usage possibilities, uncoated or coated with Fe2O3 thin film, as well as a substrate for carbon fiber or nanotube growth in future projects.
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