4.5 Article

High SERS Sensitivity Enabled by Synergistically Enhanced Photoinduced Charge Transfer in Amorphous Nonstoichiometric Semiconducting Films

Journal

ADVANCED MATERIALS INTERFACES
Volume 6, Issue 19, Pages -

Publisher

WILEY
DOI: 10.1002/admi.201901133

Keywords

amorphous; nonstoichiometric; photoinduced charge transfer; surface-enhanced Raman scattering; tungsten oxide

Funding

  1. National Key R&D Program of China [2017YFA0403600]
  2. National Natural Science Foundation of China [11874108]
  3. Fundamental Research Funds for the Central Universities
  4. Postgraduate Research & Practice Innovation Program of Jiangsu Province [KYCX17_0046]
  5. China Scholarship Council [201706090225]

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Semiconducting surface-enhanced Raman scattering (SERS) materials have attracted tremendous attention for their good signal uniformity, chemical stability, and biocompatibility. Here, a new concept to design high sensitivity semiconducting SERS substrates through integration of both amorphous and nonstoichiometric features of WO3-x thin films is presented. The integration of these two features provides narrower bandgap, additional defect levels within the bandgap, stronger exciton resonance, and higher electronic density of states near the Fermi level. These characteristics lead to a synergy to promote the photoinduced charge transfer resonance between analytes and substrate by offering efficient routes of charge escaping and transferring as well as strong vibronic coupling, thus realizing high SERS activity on amorphous nonstoichiometric WO3-x films.

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