Journal
IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY
Volume 9, Issue 5, Pages 463-470Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TTHZ.2019.2933166
Keywords
Diffuse scattering; reflection; rough surface; terahertz (THz) wireless communications
Funding
- W. M. Keck Foundation
- US National Science Foundation
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We describe measurements of the diffuse bistatic scattering of a modulated terahertz beam incident on five metallic rough surfaces, to investigate the implications of surface roughness for non-line-of-sight (NLOS) wireless data links at frequencies at and above 100 GHz. The measurements were performed using transmitter and receiver modules, operating at several frequencies from 100 to 400 GHz. We investigate the dependence of the scattering patterns on surface roughness parameters, including rms height and correlation length. The results are consistent with numerical models for scattering from a rough surface. They support the design of bistatic methods for future multiple antenna systems, remote sensing, imaging, and localization in the terahertz range. We demonstrate for the first time that data links which incorporate an NLOS reflection in a nonspecular direction can be established at frequencies above 100 GHz, with low bit error rates.
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