4.7 Article

Spectral-Spatial Hyperspectral Image Classification with Superpixel Pattern and Extreme Learning Machine

Journal

REMOTE SENSING
Volume 11, Issue 17, Pages -

Publisher

MDPI
DOI: 10.3390/rs11171983

Keywords

hyperspectral image; spectral-spatial classification; superpixel segmentation; feature extraction; extreme learning machine

Funding

  1. National Nature Science Foundation of China [61773355, 61403351, 61402424, 61573324]
  2. Natural Science Foundation of Hubei province, China [2013CFA004]
  3. National Scholarship for Building High Level Universities, China Scholarship Council (CSC) [201706410005]

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Spectral-spatial classification of hyperspectral images (HSIs) has recently attracted great attention in the research domain of remote sensing. It is well-known that, in remote sensing applications, spectral features are the fundamental information and spatial patterns provide the complementary information. With both spectral features and spatial patterns, hyperspectral image (HSI) applications can be fully explored and the classification performance can be greatly improved. In reality, spatial patterns can be extracted to represent a line, a clustering of points or image texture, which denote the local or global spatial characteristic of HSIs. In this paper, we propose a spectral-spatial HSI classification model based on superpixel pattern (SP) and kernel based extreme learning machine (KELM), called SP-KELM, to identify the land covers of pixels in HSIs. In the proposed SP-KELM model, superpixel pattern features are extracted by an advanced principal component analysis (PCA), which is based on superpixel segmentation in HSIs and used to denote spatial information. The KELM method is then employed to be a classifier in the proposed spectral-spatial model with both the original spectral features and the extracted spatial pattern features. Experimental results on three publicly available HSI datasets verify the effectiveness of the proposed SP-KELM model, with the performance improvement of 10% over the spectral approaches.

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